Electromigration in ULSI interconnections /

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on elect...

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書目詳細資料
主要作者: Tan, Cher Ming, 1959-
企業作者: World Scientific (Firm)
格式: Licensed eBooks
語言:英语
出版: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2010.
叢編:International series on advances in solid state electronics and technology.
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