Electromigration in ULSI interconnections /

Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on elect...

Бүрэн тодорхойлолт

Номзүйн дэлгэрэнгүй
Үндсэн зохиолч: Tan, Cher Ming, 1959-
Байгууллагын зохиогч: World Scientific (Firm)
Формат: Licensed eBooks
Хэл сонгох:англи
Хэвлэсэн: Singapore ; Hackensack, N.J. : World Scientific Pub. Co., ©2010.
Цуврал:International series on advances in solid state electronics and technology.
Онлайн хандалт:https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=374811