Metrics for software conceptual models /
The idea that "measuring quality is the key to developing high-qualitysoftware systems" is gaining relevance. Moreover, it is widelyrecognised that the key to obtaining better software systems is tomeasure the quality characteristics of early artefacts, produced atthe conceptual modelling...
| その他の著者: | , , |
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| フォーマット: | Licensed eBooks |
| 言語: | 英語 |
| 出版事項: |
London :
Imperial College Press,
©2005.
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| オンライン･アクセス: | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=141643 |
| 要約: | The idea that "measuring quality is the key to developing high-qualitysoftware systems" is gaining relevance. Moreover, it is widelyrecognised that the key to obtaining better software systems is tomeasure the quality characteristics of early artefacts, produced atthe conceptual modelling phase |
|---|---|
| 物理的記述: | 1 online resource (xx, 312 pages) : illustrations (some color) |
| 書誌: | Includes bibliographical references and index. |
| ISBN: | 1860946062 9781860946066 9781860944970 1860944973 1281347485 9781281347480 9786611347482 6611347488 9812389539 9789812389534 |