Electromigration in ULSI interconnections /
Electromigration in ULSI Interconnections provides a comprehensive description of the electromigration in integrated circuits. It is intended for both beginner and advanced readers on electromigration in ULSI interconnections. It begins with the basic knowledge required for a detailed study on elect...
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Korporativní autor: | |
Médium: | Licensed eBooks |
Jazyk: | angličtina |
Vydáno: |
Singapore ; Hackensack, N.J. :
World Scientific Pub. Co.,
©2010.
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Edice: | International series on advances in solid state electronics and technology.
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On-line přístup: | https://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&AN=374811 |